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    Home > Active Ingredient News > Drugs Articles > Instructions for use of semiconductor high and low temperature test equipment

    Instructions for use of semiconductor high and low temperature test equipment

    • Last Update: 2022-05-03
    • Source: Internet
    • Author: User
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    The semiconductor high and low temperature test device is used in the temperature control of the reaction chamber, the heat sink plate and the non-flammable fluid temperature control of the heat transfer medium in the semiconductor process.
    equipment
    .

    So, what should this device be aware of? Precautions for semiconductor high and low temperature test device 1.
    The power supply of semiconductor high and low temperature test device adopts three-phase four-wire system, and the power line is connected to the power line, the neutral line and the ground line
    .

    Use the perforation on the electric control box to connect the main power line of the unit to the terminal in the box to ensure that the connection is tight
    .

    2.
    Main power supply voltage: within the range of rated voltage requirements; 3.
    When the main power supply voltage fluctuation exceeds the specified range, it is not allowed to start the semiconductor high and low temperature test device, otherwise it will be regarded as improper operation, and the resulting damage is not within the scope of our company's maintenance; 4.
    The semiconductor high and low temperature test device is equipped with current overload protection, compressor discharge high and low voltage protection, motor coil overheat protection, anti-icing protection, cooling water flow interlock protection and other measures and control circuits; 5.
    Wuxi Guanya Semiconductor High The control circuit of the low-temperature test device has been installed and debugged in the factory, and cannot be changed without authorization
    .

    If you need to change, please contact Wuxi Guanya technical staff
    .

    Features of the semiconductor high and low temperature test device: 1.
    The medium circulation system of the semiconductor high and low temperature test device is tested at 7bar
    .

      2.
    The semiconductor high and low temperature test device adopts high-quality magnetic pump without mechanical shaft seal
    .

      3.
    Optimize temperature sampling and response speed, specially design control algorithm, which can quickly respond to temperature control and stability
    .

      4.
    Wuxi Guanya Semiconductor's high and low temperature test device enhances the design of the circulating pump to meet the high lift requirements of the system
    .

      5.
    Continuous high temperature cooling technology to meet the requirements of stable operation when heat is loaded on the heat sink plate and constant temperature control of cold and heat is required.

    .

    6.
    In view of the volatile characteristics of fluorinated liquid, the joint design and system sealing design are strengthened to ensure the service life of the medium
    .

     
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