Overview of X-ray fluorescence instrument (1)

(1) The development of X-ray spectroscopy

In 1895, Roentgen discovered X-rays

In 1908, CGBarkla and Sadler discovered that matter irradiated by X-rays will emit characteristic spectral lines related to the constituent elements in the matter

In 1912, Laue (MVLaue) confirmed the diffraction of X-rays in crystals

In 1913, Prague (WLBragg, WHBragg) and his son established Prague's Law

In 1913, Moseley studied the characteristic spectra of various elements and discovered Moseley's law, which laid the foundation for X-ray spectroscopy

In 1928, Geiger (H.

In 1948, Friedman (H.

In 1966, Browman and others combined radioisotope sources with Si(Li) detectors

In 1969, Birks and others developed the first energy dispersive X-ray fluorescence spectrometer

In 1971, the total reflection technique was first applied to the trace analysis of a small number of samples (Yoneda and Horiuchi)

(2) Basic principles of X-ray fluorescence analysis

The X-ray tube in the X-ray fluorescence analyzer generates X-rays.

The X-ray tube emits high-energy X-rays once, irradiates the sample, excites the chemical elements in it, and emits secondary X-rays, also called X-ray fluorescence, whose wavelength is the identification of the corresponding element—the characteristic wavelength (basic for qualitative analysis); according to the spectral line The proportional relationship between intensity and element content can be quantitatively analyzed

X-ray fluorescence analyzer (XRF) was first used in the analysis of chemical composition of various materials, and then developed into the field of environmental monitoring

The precision and reproducibility of XRF analysis are high