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[Introduction to the report]
In the fields of environmental testing, industrial quality inspection, geological exploration, etc.
Physical image of nGauge portable chip atomic force microscope (AFM)
[Live Entrance]
Please scan the QR code below to enter the live broadcast reservation interface, no registration required!
Scan the code to make an appointment now, no registration required!
[report time]
Start June 29, 2022 14:00
Ends June 29, 2022 14:30
[Speaker introduction]
Dr.
Dr.
nGauge Portable Atomic Force Microscope (AFM) Features:
Smaller and more portable
The owned AFM micro-nano electromechanical chip makes the nGauge atomic force microscope (AFM) system only the size of a briefcase and can be carried around
simpler and easier to use
The nanoscale topography information on the sample surface can be obtained with just three mouse clicks, without the need for a shock-absorbing platform
More cost-effective
The scanning speed is fast and can scan large size samples
Some application cases:
Materials - Surface Inspection of Steel Polished Samples
|
Optical microscope images |
nGauge AFM 3D Imaging |
Biological - Skin Sample
| Optical microscope images | nGauge AFM 3D Imaging |
Devices - Micro/Nano Optical Device Inspection
| SEM image | nGauge AFM 3D Imaging |
Optoelectronic device inspection
| SEM image | nGauge AFM 3D Imaging |
Partial list of articles:
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Some existing users:
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