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| Silicon-containing nanowire chips can non-invasively diagnose placental diseases |
Science and Technology Daily, Beijing, August 4 (Reporter Zhang Mengran) According to a medical research paper published in the British journal Nature Communications on the 3rd, Chinese and American scientists have greatly optimized a chip called "NanoVelcro".
The new chip Containing very thin silicon nanowires, it can be used for non-invasive early diagnosis of placental implant spectrum (PAS) diseases, which can cause pregnant women to die during childbirth
.
Placental implant spectrum diseases include invasive placenta, placenta accreta, and penetrating placenta.
Specifically, the placenta invades the myometrium excessively during pregnancy and cannot fall off during childbirth
.
This can cause severe bleeding and sometimes even maternal death
This time, a team including researchers from the University of California, Los Angeles, China’s Shenzhen People’s Hospital and other institutions have optimized the previously developed "NanoVelcro" chip.
The new chip contains very fine silicon nanowires, which are coated on the outside to detect Circulating trophoblast cells (cells that make up the placenta) antibodies
.
These cells will singly or aggregate and fall off into the maternal blood circulation during the development of the placenta
The research team performed blood tests on 168 pregnant women.
Some pregnant women were diagnosed with placental accreta spectrum disease, some were diagnosed with placenta previa (the placenta covers the internal cervix), and some placenta formation was normal
.
The team found that the counts of single and aggregate circulating trophoblast cells in the PAS group were higher than the other two groups
The researchers pointed out that a larger sample is now needed for further research
.
Placental implant spectrum diseases can cause very serious conditions for pregnant women during childbirth, and this new diagnostic technology is expected to supplement existing technologies in the near future and improve the accuracy of early diagnosis of placental implant spectrum diseases
